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Emission Measurements (2014 Edition of ANSI C63.4 and CISPR 32-2015), and Time Domain (TD) Applications (Draft C63.25)

(Visit www.c63.org for more information)

This combined workshop is presented in two parts over a two day period.  Topics covered include:  (1) review of the 2014 edition of ANSI C63.4 with an overview of CISPR 32 and (2) application of Time Domain (TD) measurements for test site validation and antenna calibration.  These workshops are designed to increase your understanding of the new C63.4 and CISPR 32 standards and the draft TD approach.  For the C63.4/CISPR 32 workshop, there will be an analysis of the test site validation including using the CISPR SVSWR method above 1 GHz, requirements for hybrid antenna use, test setup requirements and many other changes and differences.  Application of time domain methods to validating test sites will also be presented along with a demonstration on its use. For the C63.4 presentation, reference to the Canadian Innovation, Science and Economic Development equivalent will be presented. As time permits, attendees will get a chance to apply what they learned via problem solving and/or participating in the real-time time domain demonstration.

In the C63.4 workshop, you will learn:

  • RF emission measurement procedures
  • National and international regulatory implications
  • Test facility and instrumentation requirements
  • Equipment test arrangements and configurations

In the Time Domain (C63.25 draft) workshop, you will learn:

  • Application for site validation
  • Application for antenna calibration

Support material provided:

  • A complete lecture flash drive
  • FCC handouts and references

Who Should Attend:

Those responsible for determining compliance with FCC Rules and Regulations (and CISPR 22), including:

  • Product managers and developers
  • EMC engineers and test technicians
  • Regulatory compliance managers
  • Those using and calibrating antennas in making radiated emission compliance measurements
  • Calibration technicians
  • Calibration and measurement accreditation bodies
  • Lab quality assessors
  • Test instrumentation and chamber manufacturers

Expert Instructors

Workshops feature leading industry experts and ANSI C63® members, including Don Heirman, Workshop Director, (Don HEIRMAN Consultants), Jason Nixon (Innovation, Science and Economic Development Canada; formerly Industry Canada) and Zhong Chen (ETS-Lindgren).

Location – prior to the IEEE EMC Symposium in Ottawa, Canada:

1280 Teron Road
Ottawa, Ontario K2K 2C1


Friday and Saturday, July 22-23, 2016

Fee Includes:

Complete lecture flash drive, continental breakfast, lunch, breaks, completion certificate and transportation to/from the IEEE EMC symposium host hotel (Westin) and Flextronics. Fee does NOT include copies of the draft or published standards.  Fee does NOT include hotel accommodations.  For hotel information, and to reserve your hotel room see the EMC 2016 Host Hotels.


ANSI C63.4: All day Friday, July 22
8:30 am Registration
Class: 9:00 am to 5:00 pm
Time Domain C63.25: Morning only on Saturday, July 23
8:30 am:  Registration
Class: 9:00 am to 1:00 pm


Exhibit at EMC 2016

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Download the EMC 2016 Exhibitor Packet

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